Ian Wark Research Institute
ARC Special Research Centre
ARC Special Research Centre
Time-of-flight secondary ion mass spectrometer (TOF-SIMS) - Physical Electronics TRIFT II
X-ray photoelectron spectrometer (XPS) - Kratos Axis Ultra
High resolution scanning auger spectrometer - Physical Electronics PHI 600
Scanning tunnelling microscope (STM) - Nanoscope II Electrochemical and CSIRO STM
High resolution analytical scanning electron microscopes - Camscan 2-90FE, Cambridge Stereoscan 100
Optical microscope - Olympus BH2 metallurgical microscope, Sony low-light CCD camera and Optimas image analysis system
Galia image analysis system - Olympus BH2 + Microtechnics colour CCD
Atomic force microscopes - Nanoscope AFM Mark II and Mark III
