Ian Wark Research Institute
ARC Special Research Centre
ARC Special Research Centre
Time-of-flight secondary ion mass spectrometer (TOF-SIMS) - Physical Electronics TRIFT II
X-ray photoelectron spectrometer (XPS) - Kratos Axis Ultra
High resolution scanning auger spectrometer - Physical Electronics PHI 600
High resolution analytical scanning electron microscopes - Camscan 2-90FE, Cambridge Stereoscan 100
Optical microscope - Olympus BH2 metallurgical microscope, Sony low-light CCD camera and Optimas image analysis system
Galia image analysis system - Olympus BH2 + Microtechnics colour CCD
Surface area apparatus - Coulter Omnisorp Model 100
Imaging ellipsometer - Beaglehole
0.5m optical spectrometer - Thermo Jarrell-Ash
Fourier transform infrared spectrometer (FTIR) - Nicolet Magna 750, FTIR with solution, DRIFT. ATR attachments
Vane rheometer - Haake VT550 vane
Constant stress rheometer - Rheometrics SR5000 with pressure cell
attachment
Capillary rheometer - IWRI design
Dynamic mechanical analyser (DMA) - TA Instruments
Thermo-mechanical analyser (TMA) - TA Instruments
Thermal rheometer - TA Instruments
Small angle x-ray scattering apparatus (SAXS) - Kratky SAX camera and rotating anode X-ray source
Tensile testing machine - Hounsfield 5kN
Electrometer for contact electrification measurements
Nanoindenter - UMIS 2000
X-ray diffractometer (XRD) - Philips powder XRD
X-ray fluorescence system PW 14020 - Philips XRF
Instron servo-hydraulic testing machine - 8501
VTT scratch adhesion tester
High temperature pin-on-disc sliding wear tester
Contact fatigue roll-on-roll wear tester
Leitz miniload hardness tester
Surtronic 3+ surface profilometer
Dry sand rubber wheel abrasion tester
Pin-on-plate reciprocating wear machine
Kistler piezoelectric 3-axis cutting force dynometer
Optical microscopes and image analyser
Vickers hardness tester
Brinell hardness tester
Rockwell hardness tester
Compression testing machine
Hydraulic press
Vacuum furnaces
Rapid heating furnace
